As seen here, the test setup for the IEC61000-4-2 ESD immunity test consists of a 150pF capacitor which is discharged over a 330 ohm resistor across the “System Under Test”. The generated pulse form accurately simulates an actual ESD pulse form. This pulse form has a very fast rise time of under 1 nanosecond and total duration of more than 60 nanoseconds, illustrated in the top right graphic. In the table, the five robustness classes are defined with test voltages from 2 kilovolts to 8 kilovolts for contact discharge. All Nexperia protection diodes and arrays can withstand at least the highest class with an 8 kilovolt contact ESD pulse with many types able to withstand pulses of up to 30 kilovolts and above. For some types, only the capabilities of the measurement equipment restricts the specification of an ESD robustness higher than 30 kilovolts in the datasheets.