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In these graphs, measurements of the leakage current of a varistor and a Nexperia protection diode before an ESD strike, in black, and after the strike, in red, are displayed. It is clearly visible that at both ambient temperatures tested, 85°C and 150°C, the varistor shows a strong degradation whereas the Nexperia protection diode shows little or no degradation of the leakage current.
PTM Published on: 2011-11-02
