Internal processes within the NAND Flash memory device controller to manage the reading/writing of data and wear leveling increases the number of writes to the media beyond the number being transferred from the client. This increase in the number of writes is called Write Amplification, which in turn wears out memory cells. Write Amplification is measured in terms of a Write Amplification Index (WAI) or Write Amplification Factor (WAF) which are synonymous. Aligning NAND Flash write patterns to the underlying memory architecture can dramatically reduce wear on the memory device and increase its usable life.