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The charged device model test is no longer a commonly used test. This method simulates what happens in an automated manufacturing environment when an IC becomes electrically charged, and then discharges when it comes in contact with a grounded conductor. The CDM discharge is a very fast transient, which takes place over a couple of nS. This is a more challenging device to model, and is based on the size and the capacitance of the IC being tested, with little impedance to reduce the current. The result can high currents, well above 5 A to 6 A, being discharged in a short duration of one nS or less.
PTM Published on: 2011-05-16
