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Automotive Grade Transistors and Discretes Slide 13

During all the phases of the diffusion of a lot, if there is incorrect control of the process in an area of the wafer, usually it will happen in the same area in all the wafers of the lot. Wafer Map Stacking analyzes the yield for the stacked X/Y position and if the yield is lower than the minimum specified for the line, the good dice in the position X/Y are also inked as rejects.

PTM Published on: 2012-10-16