Toshiba’s latest generation of ESD diode, called EAP-IV, focuses on minimizing dynamic resistance. This allows for superior ESD protection and lower clamping voltages. In the TLP test shown on this slide, the red line shows an example of ESD diode behavior. When subjected to a 10A pulse, the ESD diode will clamp the voltage at approximately 10V. In this case, this is a part that is suitable for 5.5V lines, so even with a big ESD strike, the line will not see very high voltage peaks.