Using the same technique for estimating lifetime, the two graphs on this slide show the expected reliability under DC drain source stress at various temperatures and voltages. As can be seen, the failure rate is strongly accelerated by drain voltage and only weakly affected by temperature between 35°C and 150°C. At the V_DS(max)  of 100 V, the mean time to failure is orders of magnitude beyond the 10-year line, independent of the operating temperature. The figure on the right shows the failure in time, or FIT rate, derived directly from the MTTF. The FIT rate is below one failure per billion device hours at 110 V and is negligibly small at the maximum allowed drain voltage of 100 V.