Viking Technology employs state of the art Automated Test Equipment or ATE to perform Functional testing and Parametric testing on different generations of memory such as DDR2, DDR3, and DDR4. Functional testing is performed with dedicated pattern generation hardware in the ATE system. At present, the ATE system can test speeds up to 2,667MHz. These ATE systems can also perform AC/DC parametric testing. AC/DC parameters such as tCK, tREF, tAC, tDQSQ, tDH, tDS, tIS, and tIH can be measured to 50 ps resolution and parameters such as Vih, Vil, Vtt, Vdd/Vddq, Vref, and Idd can be measured to 5mV, 1µA resolution.