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DRAM Modules Slide 5

All semiconductor products eventually wear out and fail. Most failures occur early in the usage period of the memory module. ATP’s TDBI procedure and ATE combine to effectively screen out defective ICs and significantly lower subsequent failures on the DRAM DIMM. The end result is very robust DRAM Memory Modules with a greatly minimized long-term failure rate which extends the product service life to an estimated 20+ years.

PTM Published on: 2015-07-28