Slide 1 Slide 2 Slide 3 Slide 4 Slide 5 Slide 6 Slide 7 Slide 8 Slide 9 Slide 10 Slide 11 Slide 12 Slide 13 Slide 14 Product List
DRAM Modules Slide 10

ATP offers ATE and TDBI based on the customer’s requirements across various parameters such as marginal voltage, signal frequency, clock, command timing, or data timing. Four corner testing is available, and ATP can provide customized thermal testing for individual customer products. The ATP test process works with all motherboards and with all OS applications.

PTM Published on: 2015-07-28