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The hall effect element is a four terminal semiconductor device typically fabricated from an InAs (indium arsenide) material selected for the material’s sensitivity to magnetic fields. The control current (IC) biases the hall effect element in a quiescent state. The incident magnetic flux creates a charge separation resulting in a potential difference represented by the Hall Voltage, VH. The hall voltage is further signal conditioned to provide an instantaneous voltage representation of the measured primary current.

PTM Published on: 2011-11-03