Slide 1 Slide 2 Slide 3 Slide 4 Slide 5 Slide 6 Slide 7 Slide 8 Slide 9 Slide 10 Slide 11 Slide 12 Slide 13 Product List
hi temp oper
High temperature operational life testing of the RTAN compared to standard nichrome demonstrates the superior electrical and environmental stability of the series. For comparison, general purpose thick film chips would experience resistance shifts of typically 2% or more under the same conditions.
PTM Published on: 2017-07-19